Zhang, Y., Feng, L., Dillon, S., and Lambros, J. Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking. Retrieved from https://par.nsf.gov/biblio/10382124. Materials Characterization 183.C Web. doi:10.1016/j.matchar.2021.111598.

Zhang, Y., Feng, L., Dillon, S., & Lambros, J. Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking. Materials Characterization, 183 (C). Retrieved from https://par.nsf.gov/biblio/10382124. https://doi.org/10.1016/j.matchar.2021.111598

Zhang, Y., Feng, L., Dillon, S., and Lambros, J. "Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking". Materials Characterization 183 (C). Country unknown/Code not available. https://doi.org/10.1016/j.matchar.2021.111598. https://par.nsf.gov/biblio/10382124.

@article{osti_10382124,
place = {Country unknown/Code not available}, title = {Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking}, url = {https://par.nsf.gov/biblio/10382124}, DOI = {10.1016/j.matchar.2021.111598}, abstractNote = {}, journal = {Materials Characterization}, volume = {183}, number = {C}, author = {Zhang, Y. and Feng, L. and Dillon, S. and Lambros, J.}, }