Liu, Kang, Tan, Benjamin, Reddy, Gaurav Rajavendra, Garg, Siddharth, Makris, Yiorgos, and Karri, Ramesh. Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks. Retrieved from https://par.nsf.gov/biblio/10385354. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 40.10 Web. doi:10.1109/TCAD.2020.3033749.

Liu, Kang, Tan, Benjamin, Reddy, Gaurav Rajavendra, Garg, Siddharth, Makris, Yiorgos, & Karri, Ramesh. Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 40 (10). Retrieved from https://par.nsf.gov/biblio/10385354. https://doi.org/10.1109/TCAD.2020.3033749

Liu, Kang, Tan, Benjamin, Reddy, Gaurav Rajavendra, Garg, Siddharth, Makris, Yiorgos, and Karri, Ramesh. "Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 40 (10). Country unknown/Code not available. https://doi.org/10.1109/TCAD.2020.3033749. https://par.nsf.gov/biblio/10385354.

@article{osti_10385354,
place = {Country unknown/Code not available}, title = {Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks}, url = {https://par.nsf.gov/biblio/10385354}, DOI = {10.1109/TCAD.2020.3033749}, abstractNote = {}, journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, volume = {40}, number = {10}, author = {Liu, Kang and Tan, Benjamin and Reddy, Gaurav Rajavendra and Garg, Siddharth and Makris, Yiorgos and Karri, Ramesh}, }