Miller, James M.L., Alter, Anne L., Bousse, Nicholas E., Chen, Yunhan, Flader, Ian B., Shin, Dongsuk D., Kenny, Thomas W., and Shaw, Steven W. Influence of Clamping Loss and Electrical Damping On Nonlinear Dissipation in Micromechanical Resonators. Retrieved from https://par.nsf.gov/biblio/10386063. 2022 IEEE International Conference on Micro Electro Mechanical Systems . Web. doi:10.1109/MEMS51670.2022.9699668.

Miller, James M.L., Alter, Anne L., Bousse, Nicholas E., Chen, Yunhan, Flader, Ian B., Shin, Dongsuk D., Kenny, Thomas W., & Shaw, Steven W. Influence of Clamping Loss and Electrical Damping On Nonlinear Dissipation in Micromechanical Resonators. 2022 IEEE International Conference on Micro Electro Mechanical Systems, (). Retrieved from https://par.nsf.gov/biblio/10386063. https://doi.org/10.1109/MEMS51670.2022.9699668

Miller, James M.L., Alter, Anne L., Bousse, Nicholas E., Chen, Yunhan, Flader, Ian B., Shin, Dongsuk D., Kenny, Thomas W., and Shaw, Steven W. "Influence of Clamping Loss and Electrical Damping On Nonlinear Dissipation in Micromechanical Resonators". 2022 IEEE International Conference on Micro Electro Mechanical Systems (). Country unknown/Code not available. https://doi.org/10.1109/MEMS51670.2022.9699668. https://par.nsf.gov/biblio/10386063.

@article{osti_10386063,
place = {Country unknown/Code not available}, title = {Influence of Clamping Loss and Electrical Damping On Nonlinear Dissipation in Micromechanical Resonators}, url = {https://par.nsf.gov/biblio/10386063}, DOI = {10.1109/MEMS51670.2022.9699668}, abstractNote = {}, journal = {2022 IEEE International Conference on Micro Electro Mechanical Systems}, author = {Miller, James M.L. and Alter, Anne L. and Bousse, Nicholas E. and Chen, Yunhan and Flader, Ian B. and Shin, Dongsuk D. and Kenny, Thomas W. and Shaw, Steven W.}, }