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Breidenbach, A. T., Yu, H., Peterson, T. A., McFadden, A. P., Peria, W. K., Palmstrøm, C. J., and Crowell, P. A. Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1−x and Co2FeAl. Retrieved from https://par.nsf.gov/biblio/10389745. Physical Review B 105.14 Web. doi:10.1103/PhysRevB.105.144405.
Breidenbach, A. T., Yu, H., Peterson, T. A., McFadden, A. P., Peria, W. K., Palmstrøm, C. J., & Crowell, P. A. Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1−x and Co2FeAl. Physical Review B, 105 (14). Retrieved from https://par.nsf.gov/biblio/10389745. https://doi.org/10.1103/PhysRevB.105.144405
Breidenbach, A. T., Yu, H., Peterson, T. A., McFadden, A. P., Peria, W. K., Palmstrøm, C. J., and Crowell, P. A.
"Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1−x and Co2FeAl". Physical Review B 105 (14). Country unknown/Code not available. https://doi.org/10.1103/PhysRevB.105.144405.https://par.nsf.gov/biblio/10389745.
@article{osti_10389745,
place = {Country unknown/Code not available},
title = {Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1−x and Co2FeAl},
url = {https://par.nsf.gov/biblio/10389745},
DOI = {10.1103/PhysRevB.105.144405},
abstractNote = {},
journal = {Physical Review B},
volume = {105},
number = {14},
author = {Breidenbach, A. T. and Yu, H. and Peterson, T. A. and McFadden, A. P. and Peria, W. K. and Palmstrøm, C. J. and Crowell, P. A.},
}
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