Yan, Zheyu, Hu, Xiaobo Sharon, and Shi, Yiyu. Computing-In-Memory Neural Network Accelerators for Safety-Critical Systems: Can Small Device Variations Be Disastrous?. Retrieved from https://par.nsf.gov/biblio/10391326. IEEE/ACM International Conference on Computer-Aided Design . Web. doi:10.1145/3508352.3549360.
Yan, Zheyu, Hu, Xiaobo Sharon, & Shi, Yiyu. Computing-In-Memory Neural Network Accelerators for Safety-Critical Systems: Can Small Device Variations Be Disastrous?. IEEE/ACM International Conference on Computer-Aided Design, (). Retrieved from https://par.nsf.gov/biblio/10391326. https://doi.org/10.1145/3508352.3549360
Yan, Zheyu, Hu, Xiaobo Sharon, and Shi, Yiyu.
"Computing-In-Memory Neural Network Accelerators for Safety-Critical Systems: Can Small Device Variations Be Disastrous?". IEEE/ACM International Conference on Computer-Aided Design (). Country unknown/Code not available. https://doi.org/10.1145/3508352.3549360.https://par.nsf.gov/biblio/10391326.
@article{osti_10391326,
place = {Country unknown/Code not available},
title = {Computing-In-Memory Neural Network Accelerators for Safety-Critical Systems: Can Small Device Variations Be Disastrous?},
url = {https://par.nsf.gov/biblio/10391326},
DOI = {10.1145/3508352.3549360},
abstractNote = {},
journal = {IEEE/ACM International Conference on Computer-Aided Design},
author = {Yan, Zheyu and Hu, Xiaobo Sharon and Shi, Yiyu},
}
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