Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, and Kim, DongHyun. Far-End Crosstalk Modeling and Prediction for Stripline With Inhomogeneous Dielectric Layers (IDLs). Retrieved from https://par.nsf.gov/biblio/10392671. IEEE Transactions on Signal and Power Integrity 1. Web. doi:10.1109/TSIPI.2022.3203031.

Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, & Kim, DongHyun. Far-End Crosstalk Modeling and Prediction for Stripline With Inhomogeneous Dielectric Layers (IDLs). IEEE Transactions on Signal and Power Integrity, 1 (). Retrieved from https://par.nsf.gov/biblio/10392671. https://doi.org/10.1109/TSIPI.2022.3203031

Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, and Kim, DongHyun. "Far-End Crosstalk Modeling and Prediction for Stripline With Inhomogeneous Dielectric Layers (IDLs)". IEEE Transactions on Signal and Power Integrity 1 (). Country unknown/Code not available. https://doi.org/10.1109/TSIPI.2022.3203031. https://par.nsf.gov/biblio/10392671.

@article{osti_10392671,
place = {Country unknown/Code not available}, title = {Far-End Crosstalk Modeling and Prediction for Stripline With Inhomogeneous Dielectric Layers (IDLs)}, url = {https://par.nsf.gov/biblio/10392671}, DOI = {10.1109/TSIPI.2022.3203031}, abstractNote = {}, journal = {IEEE Transactions on Signal and Power Integrity}, volume = {1}, author = {Liu, Yuanzhuo and Yong, Shaohui and Guo, Yuandong and He, Jiayi and Li, Chaofeng and Ye, Xiaoning and Fan, Jun and Kim, DongHyun}, }