Guo, Yuandong, Kim, DongHyun, Liu, Yuanzhuo, Ye, Xiaoning, Hsu, Jimmy, and Fan, Jun. Insertion Loss Reduction Using Rounded Corners to Mitigate Surface Roughness Effect in PCB Transmission Lines. Retrieved from https://par.nsf.gov/biblio/10393346. 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) . Web. doi:10.1109/APEMC53576.2022.9888577.

Guo, Yuandong, Kim, DongHyun, Liu, Yuanzhuo, Ye, Xiaoning, Hsu, Jimmy, & Fan, Jun. Insertion Loss Reduction Using Rounded Corners to Mitigate Surface Roughness Effect in PCB Transmission Lines. 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), (). Retrieved from https://par.nsf.gov/biblio/10393346. https://doi.org/10.1109/APEMC53576.2022.9888577

Guo, Yuandong, Kim, DongHyun, Liu, Yuanzhuo, Ye, Xiaoning, Hsu, Jimmy, and Fan, Jun. "Insertion Loss Reduction Using Rounded Corners to Mitigate Surface Roughness Effect in PCB Transmission Lines". 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) (). Country unknown/Code not available. https://doi.org/10.1109/APEMC53576.2022.9888577. https://par.nsf.gov/biblio/10393346.

@article{osti_10393346,
place = {Country unknown/Code not available}, title = {Insertion Loss Reduction Using Rounded Corners to Mitigate Surface Roughness Effect in PCB Transmission Lines}, url = {https://par.nsf.gov/biblio/10393346}, DOI = {10.1109/APEMC53576.2022.9888577}, abstractNote = {}, journal = {2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)}, author = {Guo, Yuandong and Kim, DongHyun and Liu, Yuanzhuo and Ye, Xiaoning and Hsu, Jimmy and Fan, Jun}, }