Du, Zhe, Sattar, Yahya, Tarzanagh, Davoud Ataee, Balzano, Laura, Ozay, Necmiye, and Oymak, Samet. Data-driven control of markov jump systems: Sample complexity and regret bounds. Retrieved from https://par.nsf.gov/biblio/10394718. 2022 American Control Conference (ACC) . Web. doi:10.23919/ACC53348.2022.9867863.
Du, Zhe, Sattar, Yahya, Tarzanagh, Davoud Ataee, Balzano, Laura, Ozay, Necmiye, & Oymak, Samet. Data-driven control of markov jump systems: Sample complexity and regret bounds. 2022 American Control Conference (ACC), (). Retrieved from https://par.nsf.gov/biblio/10394718. https://doi.org/10.23919/ACC53348.2022.9867863
Du, Zhe, Sattar, Yahya, Tarzanagh, Davoud Ataee, Balzano, Laura, Ozay, Necmiye, and Oymak, Samet.
"Data-driven control of markov jump systems: Sample complexity and regret bounds". 2022 American Control Conference (ACC) (). Country unknown/Code not available. https://doi.org/10.23919/ACC53348.2022.9867863.https://par.nsf.gov/biblio/10394718.
@article{osti_10394718,
place = {Country unknown/Code not available},
title = {Data-driven control of markov jump systems: Sample complexity and regret bounds},
url = {https://par.nsf.gov/biblio/10394718},
DOI = {10.23919/ACC53348.2022.9867863},
abstractNote = {},
journal = {2022 American Control Conference (ACC)},
author = {Du, Zhe and Sattar, Yahya and Tarzanagh, Davoud Ataee and Balzano, Laura and Ozay, Necmiye and Oymak, Samet},
}
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