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Title: An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines
Award ID(s):
1916535
NSF-PAR ID:
10394892
Author(s) / Creator(s):
; ; ; ; ; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Signal and Power Integrity
Volume:
1
ISSN:
2768-1866
Page Range / eLocation ID:
130 to 139
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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