Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, Khilkevich, Victor, and Kim, DongHyun. An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines. Retrieved from https://par.nsf.gov/biblio/10394892. IEEE Transactions on Signal and Power Integrity 1. Web. doi:10.1109/TSIPI.2022.3214172.

Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, Khilkevich, Victor, & Kim, DongHyun. An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines. IEEE Transactions on Signal and Power Integrity, 1 (). Retrieved from https://par.nsf.gov/biblio/10394892. https://doi.org/10.1109/TSIPI.2022.3214172

Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, Khilkevich, Victor, and Kim, DongHyun. "An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines". IEEE Transactions on Signal and Power Integrity 1 (). Country unknown/Code not available. https://doi.org/10.1109/TSIPI.2022.3214172. https://par.nsf.gov/biblio/10394892.

@article{osti_10394892,
place = {Country unknown/Code not available}, title = {An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines}, url = {https://par.nsf.gov/biblio/10394892}, DOI = {10.1109/TSIPI.2022.3214172}, abstractNote = {}, journal = {IEEE Transactions on Signal and Power Integrity}, volume = {1}, author = {Liu, Yuanzhuo and Yong, Shaohui and Guo, Yuandong and He, Jiayi and Li, Chaofeng and Ye, Xiaoning and Fan, Jun and Khilkevich, Victor and Kim, DongHyun}, }