Cayci, Semih, Satpathi, Siddhartha, He, Niao, and Srikant, R. Sample Complexity and Overparameterization Bounds for Temporal-Difference Learning With Neural Network Approximation. Retrieved from https://par.nsf.gov/biblio/10410556. IEEE Transactions on Automatic Control 68.5 Web. doi:10.1109/TAC.2023.3234234.

Cayci, Semih, Satpathi, Siddhartha, He, Niao, & Srikant, R. Sample Complexity and Overparameterization Bounds for Temporal-Difference Learning With Neural Network Approximation. IEEE Transactions on Automatic Control, 68 (5). Retrieved from https://par.nsf.gov/biblio/10410556. https://doi.org/10.1109/TAC.2023.3234234

Cayci, Semih, Satpathi, Siddhartha, He, Niao, and Srikant, R. "Sample Complexity and Overparameterization Bounds for Temporal-Difference Learning With Neural Network Approximation". IEEE Transactions on Automatic Control 68 (5). Country unknown/Code not available. https://doi.org/10.1109/TAC.2023.3234234. https://par.nsf.gov/biblio/10410556.

@article{osti_10410556,
place = {Country unknown/Code not available}, title = {Sample Complexity and Overparameterization Bounds for Temporal-Difference Learning With Neural Network Approximation}, url = {https://par.nsf.gov/biblio/10410556}, DOI = {10.1109/TAC.2023.3234234}, abstractNote = {}, journal = {IEEE Transactions on Automatic Control}, volume = {68}, number = {5}, author = {Cayci, Semih and Satpathi, Siddhartha and He, Niao and Srikant, R.}, }