Li, Zezhou, Cheng, Justin Y., Poplawsky, Jonathan D., Xu, Shuozhi, Baldwin, Jon K., Beyerlein, Irene J., and Mara, Nathan A. Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography. Retrieved from https://par.nsf.gov/biblio/10411262. Scripta Materialia 223.C Web. doi:10.1016/j.scriptamat.2022.115078.

Li, Zezhou, Cheng, Justin Y., Poplawsky, Jonathan D., Xu, Shuozhi, Baldwin, Jon K., Beyerlein, Irene J., & Mara, Nathan A. Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography. Scripta Materialia, 223 (C). Retrieved from https://par.nsf.gov/biblio/10411262. https://doi.org/10.1016/j.scriptamat.2022.115078

Li, Zezhou, Cheng, Justin Y., Poplawsky, Jonathan D., Xu, Shuozhi, Baldwin, Jon K., Beyerlein, Irene J., and Mara, Nathan A. "Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography". Scripta Materialia 223 (C). Country unknown/Code not available. https://doi.org/10.1016/j.scriptamat.2022.115078. https://par.nsf.gov/biblio/10411262.

@article{osti_10411262,
place = {Country unknown/Code not available}, title = {Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography}, url = {https://par.nsf.gov/biblio/10411262}, DOI = {10.1016/j.scriptamat.2022.115078}, abstractNote = {}, journal = {Scripta Materialia}, volume = {223}, number = {C}, author = {Li, Zezhou and Cheng, Justin Y. and Poplawsky, Jonathan D. and Xu, Shuozhi and Baldwin, Jon K. and Beyerlein, Irene J. and Mara, Nathan A.}, }