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Title: Combining STEM Imaging and X-Ray Diffraction for Structure Determination of a New Highly Distorted Infinite-Layer Phase
Award ID(s):
1719875
NSF-PAR ID:
10411493
Author(s) / Creator(s):
; ; ; ; ; ;
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
28
Issue:
S1
ISSN:
1431-9276
Page Range / eLocation ID:
2582 to 2584
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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