Colletta, Michael, Yang, Yao, Goodge, Berit H, Abruña, Héctor D, and Kourkoutis, Lena F. Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells. Retrieved from https://par.nsf.gov/biblio/10411662. Microscopy and Microanalysis 28.S1 Web. doi:10.1017/S1431927622008534.

Colletta, Michael, Yang, Yao, Goodge, Berit H, Abruña, Héctor D, & Kourkoutis, Lena F. Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells. Microscopy and Microanalysis, 28 (S1). Retrieved from https://par.nsf.gov/biblio/10411662. https://doi.org/10.1017/S1431927622008534

Colletta, Michael, Yang, Yao, Goodge, Berit H, Abruña, Héctor D, and Kourkoutis, Lena F. "Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells". Microscopy and Microanalysis 28 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927622008534. https://par.nsf.gov/biblio/10411662.

@article{osti_10411662,
place = {Country unknown/Code not available}, title = {Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells}, url = {https://par.nsf.gov/biblio/10411662}, DOI = {10.1017/S1431927622008534}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {28}, number = {S1}, author = {Colletta, Michael and Yang, Yao and Goodge, Berit H and Abruña, Héctor D and Kourkoutis, Lena F}, }