Norcini, D., Castelló-Mor, N., Baxter, D., Corso, N. J., Cuevas-Zepeda, J., De Dominicis, C., Matalon, A., Munagavalasa, S., Paul, S., Privitera, P., Ramanathan, K., Smida, R., Thomas, R., Yajur, R., Chavarria, A. E., McGuire, K., Mitra, P., Piers, A., Settimo, M., Gutiérrez, J. Cortabitarte, Duarte-Campderros, J., Lantero-Barreda, A., Lopez-Virto, A., Vila, I., Vilar, R., Avalos, N., Bertou, X., Dastgheibi-Fard, A., Deligny, O., Estrada, E., Gadola, N., Gaïor, R., Hossbach, T., Khalil, L., Kilminster, B., Lawson, I., Lee, S., Letessier-Selvon, A., Loaiza, P., Papadopoulos, G., Robmann, P., Traina, M., Warot, G., and Zopounidis, J-P. Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection. Retrieved from https://par.nsf.gov/biblio/10428303. Physical Review D 106.9 Web. doi:10.1103/PhysRevD.106.092001.

Norcini, D., Castelló-Mor, N., Baxter, D., Corso, N. J., Cuevas-Zepeda, J., De Dominicis, C., Matalon, A., Munagavalasa, S., Paul, S., Privitera, P., Ramanathan, K., Smida, R., Thomas, R., Yajur, R., Chavarria, A. E., McGuire, K., Mitra, P., Piers, A., Settimo, M., Gutiérrez, J. Cortabitarte, Duarte-Campderros, J., Lantero-Barreda, A., Lopez-Virto, A., Vila, I., Vilar, R., Avalos, N., Bertou, X., Dastgheibi-Fard, A., Deligny, O., Estrada, E., Gadola, N., Gaïor, R., Hossbach, T., Khalil, L., Kilminster, B., Lawson, I., Lee, S., Letessier-Selvon, A., Loaiza, P., Papadopoulos, G., Robmann, P., Traina, M., Warot, G., & Zopounidis, J-P. Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection. Physical Review D, 106 (9). Retrieved from https://par.nsf.gov/biblio/10428303. https://doi.org/10.1103/PhysRevD.106.092001

Norcini, D., Castelló-Mor, N., Baxter, D., Corso, N. J., Cuevas-Zepeda, J., De Dominicis, C., Matalon, A., Munagavalasa, S., Paul, S., Privitera, P., Ramanathan, K., Smida, R., Thomas, R., Yajur, R., Chavarria, A. E., McGuire, K., Mitra, P., Piers, A., Settimo, M., Gutiérrez, J. Cortabitarte, Duarte-Campderros, J., Lantero-Barreda, A., Lopez-Virto, A., Vila, I., Vilar, R., Avalos, N., Bertou, X., Dastgheibi-Fard, A., Deligny, O., Estrada, E., Gadola, N., Gaïor, R., Hossbach, T., Khalil, L., Kilminster, B., Lawson, I., Lee, S., Letessier-Selvon, A., Loaiza, P., Papadopoulos, G., Robmann, P., Traina, M., Warot, G., and Zopounidis, J-P. "Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection". Physical Review D 106 (9). Country unknown/Code not available. https://doi.org/10.1103/PhysRevD.106.092001. https://par.nsf.gov/biblio/10428303.

@article{osti_10428303,
place = {Country unknown/Code not available}, title = {Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection}, url = {https://par.nsf.gov/biblio/10428303}, DOI = {10.1103/PhysRevD.106.092001}, abstractNote = {}, journal = {Physical Review D}, volume = {106}, number = {9}, author = {Norcini, D. and Castelló-Mor, N. and Baxter, D. and Corso, N. J. and Cuevas-Zepeda, J. and De Dominicis, C. and Matalon, A. and Munagavalasa, S. and Paul, S. and Privitera, P. and Ramanathan, K. and Smida, R. and Thomas, R. and Yajur, R. and Chavarria, A. E. and McGuire, K. and Mitra, P. and Piers, A. and Settimo, M. and Gutiérrez, J. Cortabitarte and Duarte-Campderros, J. and Lantero-Barreda, A. and Lopez-Virto, A. and Vila, I. and Vilar, R. and Avalos, N. and Bertou, X. and Dastgheibi-Fard, A. and Deligny, O. and Estrada, E. and Gadola, N. and Gaïor, R. and Hossbach, T. and Khalil, L. and Kilminster, B. and Lawson, I. and Lee, S. and Letessier-Selvon, A. and Loaiza, P. and Papadopoulos, G. and Robmann, P. and Traina, M. and Warot, G. and Zopounidis, J-P.}, }