Zhao, Dexin, Patel, Aniket, Barbosa, Aaron, Hansen, Marcus H., Wang, Ainiu L., Dong, Jiaqi, Zhang, Yuwei, Umale, Tejas, Karaman, Ibrahim, Shamberger, Patrick, Banerjee, Sarbajit, Pharr, Matt, and Xie, Kelvin Y. A reference-area-free strain mapping method using precession electron diffraction data. Retrieved from https://par.nsf.gov/biblio/10428897. Ultramicroscopy 247.C Web. doi:10.1016/j.ultramic.2023.113700.

Zhao, Dexin, Patel, Aniket, Barbosa, Aaron, Hansen, Marcus H., Wang, Ainiu L., Dong, Jiaqi, Zhang, Yuwei, Umale, Tejas, Karaman, Ibrahim, Shamberger, Patrick, Banerjee, Sarbajit, Pharr, Matt, & Xie, Kelvin Y. A reference-area-free strain mapping method using precession electron diffraction data. Ultramicroscopy, 247 (C). Retrieved from https://par.nsf.gov/biblio/10428897. https://doi.org/10.1016/j.ultramic.2023.113700

Zhao, Dexin, Patel, Aniket, Barbosa, Aaron, Hansen, Marcus H., Wang, Ainiu L., Dong, Jiaqi, Zhang, Yuwei, Umale, Tejas, Karaman, Ibrahim, Shamberger, Patrick, Banerjee, Sarbajit, Pharr, Matt, and Xie, Kelvin Y. "A reference-area-free strain mapping method using precession electron diffraction data". Ultramicroscopy 247 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2023.113700. https://par.nsf.gov/biblio/10428897.

@article{osti_10428897,
place = {Country unknown/Code not available}, title = {A reference-area-free strain mapping method using precession electron diffraction data}, url = {https://par.nsf.gov/biblio/10428897}, DOI = {10.1016/j.ultramic.2023.113700}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {247}, number = {C}, author = {Zhao, Dexin and Patel, Aniket and Barbosa, Aaron and Hansen, Marcus H. and Wang, Ainiu L. and Dong, Jiaqi and Zhang, Yuwei and Umale, Tejas and Karaman, Ibrahim and Shamberger, Patrick and Banerjee, Sarbajit and Pharr, Matt and Xie, Kelvin Y.}, }