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Title: Surface 4 He Adsorption Level Determination with a Microelectromechanical Oscillator
A controlled amount of helium-4 is adsorbed onto a microelectromechanical oscillator. The number of 4He atomic monolayers is extracted from the change of the effective mass of the oscillator by measuring the resonance frequency shift of the oscillator in its shear eigenmode. The method gives a mass resolution of ≈7×10−17kg, and allows for direct measurement of the 4He adsorption level with the same device that is used in 3He experiments.  more » « less
Award ID(s):
1708818
PAR ID:
10434582
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Proceedings of the 29th International Conference on Low Temperature Physics
Volume:
38
Page Range / eLocation ID:
01191
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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