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Award ID contains: 1708818

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  1. A controlled amount of helium-4 is adsorbed onto a microelectromechanical oscillator. The number of 4He atomic monolayers is extracted from the change of the effective mass of the oscillator by measuring the resonance frequency shift of the oscillator in its shear eigenmode. The method gives a mass resolution of ≈7×10−17kg, and allows for direct measurement of the 4He adsorption level with the same device that is used in 3He experiments. 
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