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Title: Universal conductance fluctuations in nanoscale topological insulator devices

Topological materials are promising candidates in fault-tolerant quantum information processing architectures, making it essential to understand the dephasing mechanisms in these materials. Here, we investigate gated, nanoscale mesas fabricated on thin films of cadmium arsenide (Cd3As2), a three-dimensional Dirac semimetal that can be tuned into different topological phases. We observe two independent types of conductance oscillations, one as a function of the applied magnetic field and the other as a function of the gate voltage. Varying the dimensions of the nanostructures allows the discrimination of a variety of scenarios for similar oscillations previously reported in the literature. We conclude that the conductance oscillations are not a signature of topological boundary states per se, but rather are universal conductance fluctuations. These results broadly inform future interpretations of electronic quantum interference in mesoscopic devices made from topological materials.

 
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NSF-PAR ID:
10440334
Author(s) / Creator(s):
; ; ;
Publisher / Repository:
American Institute of Physics
Date Published:
Journal Name:
Applied Physics Letters
Volume:
122
Issue:
5
ISSN:
0003-6951
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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