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Deterministic Conductive Filament Formation and Evolution for Improved Switching Uniformity in Embedded Metal-Oxide-Based Memristors─A Phase-Field Study
- Award ID(s):
- 2132105
- NSF-PAR ID:
- 10441041
- Date Published:
- Journal Name:
- ACS Applied Materials & Interfaces
- Volume:
- 15
- Issue:
- 17
- ISSN:
- 1944-8244
- Page Range / eLocation ID:
- 21219 to 21227
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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