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Title: Deterministic Conductive Filament Formation and Evolution for Improved Switching Uniformity in Embedded Metal-Oxide-Based Memristors─A Phase-Field Study
Award ID(s):
2132105
NSF-PAR ID:
10441041
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
ACS Applied Materials & Interfaces
Volume:
15
Issue:
17
ISSN:
1944-8244
Page Range / eLocation ID:
21219 to 21227
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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