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Title: Characterizing HfO 2 -Based Ferroelectric Tunnel Junction in Cryogenic Temperature
Award ID(s):
2218604
PAR ID:
10442395
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Electron Devices
Volume:
69
Issue:
10
ISSN:
0018-9383
Page Range / eLocation ID:
5948 to 5951
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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