The behavior of polar LaMnO3(LMO) thin films deposited epitaxially on nonpolar SrTiO3(001) (STO) is dictated by both the LMO/STO band alignment and the chemistry of the Mn cation. Using in situ X‐ray photoelectron spectroscopy, the valence band offset (VBO) of LMO/STO heterojunctions is directly measured as a function of thickness, and found that the VBO is 2.5 eV for thicker (≥3 u.c.) films. No evidence of a built‐in electric field in LMO films of any thickness is found. Measurements of the Mn valence by Mn
The electronic structure of the two‐dimensional electron system (2DES) found at the Al/SrTiO3(Al/STO) and LaAlO3/SrTiO3(LAO/STO) interfaces is measured by means of laser angle resolved photoemission spectroscopy, taking advantage of the large photoelectron escape depth at low photon energy to probe these buried interfaces. The possibility of tuning the electronic density in Al/STO by varying the Al layer thickness is demonstrated, and it is shown that the electronic structure evolution is well described by self‐consistent tight binding supercell calculations, but differs qualitatively from a rigid band shift model. It is shown that both 2DES are strongly coupled to longitudinal optical phonons, in agreement with previous reports of a polaronic ground state in similar STO based 2DESs. Tuning the electronic density in Al/STO to match that of LAO/STO and comparing both systems, it is estimated that the intrinsic LAO/STO 2DES has a bare band width of ≈60 meV and a carrier density of ≈6 × 1013cm−2.
more » « less- NSF-PAR ID:
- 10446110
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Electronic Materials
- Volume:
- 8
- Issue:
- 7
- ISSN:
- 2199-160X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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