Understanding Vmin Failures for Improved Testing of Timing Marginalities
- Award ID(s):
- 1910964
- NSF-PAR ID:
- 10447766
- Date Published:
- Journal Name:
- 2022 IEEE International Test Conference (ITC)
- Page Range / eLocation ID:
- 372 to 381
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/ITC50671.2022.00046
