Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for chemical analysis of surfaces. ToF-SIMS is a powerful tool for polymer science because it detects a broad mass range with good mass resolution, thereby distinguishing between polymers that have similar elemental compositions and/or the same types of functional groups. Chemical labeling techniques that enhance contrast, such as deuterating or staining one constituent, are generally unnecessary. ToF-SIMS can generate both two-dimensional images and three-dimensional depth profiles, where each pixel in an image is associated with a complete mass spectrum. This Review begins by introducing the principles of ToF-SIMS measurements, including instrumentation, modes of operation, strategies for data analysis, and strengths/limitations when characterizing polymer surfaces. The sections that follow describe applications in polymer science that benefit from characterization by ToF-SIMS, including thin films and coatings, polymer blends, composites, and electronic materials. The examples selected for discussion showcase the three standard modes of operation (spectral analysis, imaging, and depth profiling) and highlight practical considerations that relate to experimental design and data processing. We conclude with brief comments about broader opportunities for ToF-SIMS in polymer science.
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Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a versatile surface-sensitive technique for characterizing both hard and soft matter. Its chemical and molecular specificity, high spatial resolution, and superior sensitivity make it an ideal method for depth profiling polymeric systems, including those comprised of both inorganic and organic constituents (i.e., polymer nanocomposites, PNCs). To best utilize ToF-SIMS for characterizing PNCs, experimental conditions must be optimized to minimize challenges such as the matrix effect and charge accumulation. Toward that end, we have successfully used ToF-SIMS with a Xe+ focused ion beam to depth profile silica nanoparticles grafted with poly(methyl methacrylate) (PMMA-NP) in a poly(styrene-ran-acrylonitrile) matrix film by selecting conditions that address charge compensation and the primary incident beam angles. By tracking the sputtered Si+ species and fitting the resultant concentration profile, the diffusion coefficient of PMMA-NP was determined to be D = 2.4 × 10−14 cm2/s. This value of D lies between that measured using Rutherford backscattering spectrometry (6.4 × 10−14 cm2/s) and the value predicted by the Stokes–Einstein model (2.5 × 10−15 cm2/s). With carefully tuned experimental parameters, ToF-SIMS holds great potential for quantitatively characterizing the nanoparticles at the surfaces and interfaces within PNC materials as well as soft matter in general.
more » « less- Award ID(s):
- 1905912
- NSF-PAR ID:
- 10448000
- Publisher / Repository:
- Oxford University Press
- Date Published:
- Journal Name:
- Microscopy and Microanalysis
- ISSN:
- 1431-9276
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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