Ultrathin and two-dimensional (2D) metals can support strong plasmons, with concomitant tight field confinement and large field enhancement. Accordingly, 2D-metal nanostructures exhibiting plasmonic resonances are highly sensitive to the environment and intrinsically suitable for optical sensing. Here, based on a proof-of-concept numerical study, nano-engineered ultrathin 2D-metal films that support infrared plasmons are demonstrated to enable highly responsive refractive index (RI) sensing. For 3 nm-Au nanoribbons exhibiting plasmonic resonances at wavelengths around 1600 nm, a RI sensitivity of SRI > 650 nm per refractive index unit (RIU) is observed for a 100 nm-thick analyte layer. A parametric study of the 2D-Au system indicates the strong dependence of the RI sensitivity on the 2D-metal thickness. Furthermore, for an analyte layer as thin as 1 nm, a RI sensitivity up to 110 (90 nm/RIU) is observed in atomically thin 2D-In (2D-Ga) nanoribbons exhibiting highly localized plasmonic resonances at mid-infrared wavelengths. Our results not only reveal the extraordinary sensing characteristics of 2D-metal systems but also provide insight into the development of 2D-metal-based plasmonic devices for enhanced IR detection.
A sensing platform is presented that uses dielectric Huygens source metasurfaces to measure refractive index changes in a microfluidic channel with experimentally measured sensitivity of 323 nm RIU−1, a figure of merit (FOM) of 5.4, and a response of 8.2 (820%) change in transmittance per refractive index unit (T/RIU). Changes in the refractive index of liquids flown through the channel are measured by single‐wavelength transmittance measurement, requiring only a simple light source and photodetector, significantly reducing device expense in comparison to state‐of‐the‐art refractive index sensing technologies. A technoeconomic analysis predicts a device costing ≈$2400 that is capable of detecting refractive index changes of the order of 2*10−8. The metasurfaces utilized are low profile, scalable, and use materials and fabrication processes compatible with CMOS and other technologies making them suitable for device integration. The Huygens metasurface system, characterized by spectrally overlapping electric and magnetic dipole modes, offers a high degree of customizability. Interplay between the two resonances may be controlled via metasurface geometry, leading to tunability of device sensitivity and measurement range. Ultrahigh sensitivity of 350 nm RIU−1with FOM of 219, corresponding to single‐wavelength sensitivity of 360 RIU−1, is demonstrated computationally through use of antisymmetric resonances of a Huygens metasurface illuminated at small incidence angles.
more » « less- Award ID(s):
- 1654765
- NSF-PAR ID:
- 10462515
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Materials Technologies
- Volume:
- 4
- Issue:
- 2
- ISSN:
- 2365-709X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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