Ghanbari, Ali, Thomas, Deepak-George, Arshad, Muhammad Arbab, and Rajan, Hridesh. Mutation-based Fault Localization of Deep Neural Networks. Retrieved from https://par.nsf.gov/biblio/10463874. 8th IEEE/ACM International Conference on Automated Software Engineering (ASE 2023) .
Ghanbari, Ali, Thomas, Deepak-George, Arshad, Muhammad Arbab, and Rajan, Hridesh.
"Mutation-based Fault Localization of Deep Neural Networks". 8th IEEE/ACM International Conference on Automated Software Engineering (ASE 2023) (). Country unknown/Code not available. https://par.nsf.gov/biblio/10463874.
@article{osti_10463874,
place = {Country unknown/Code not available},
title = {Mutation-based Fault Localization of Deep Neural Networks},
url = {https://par.nsf.gov/biblio/10463874},
abstractNote = {},
journal = {8th IEEE/ACM International Conference on Automated Software Engineering (ASE 2023)},
author = {Ghanbari, Ali and Thomas, Deepak-George and Arshad, Muhammad Arbab and Rajan, Hridesh},
}
Warning: Leaving National Science Foundation Website
You are now leaving the National Science Foundation website to go to a non-government website.
Website:
NSF takes no responsibility for and exercises no control over the views expressed or the accuracy of
the information contained on this site. Also be aware that NSF's privacy policy does not apply to this site.