Liu, Yuanzhuo, Bai, Siqi, Li, Chaofeng, De Moura, Vanine Sabino, Chen, Bichen, Venkataraman, Srinivas, Wang, Xu, and Kim, DongHyun. Inhomogeneous Dielectric Induced Skew Modeling of Twinax Cables. Retrieved from https://par.nsf.gov/biblio/10465741. IEEE Transactions on Signal and Power Integrity 2. Web. doi:10.1109/TSIPI.2023.3278613.

Liu, Yuanzhuo, Bai, Siqi, Li, Chaofeng, De Moura, Vanine Sabino, Chen, Bichen, Venkataraman, Srinivas, Wang, Xu, & Kim, DongHyun. Inhomogeneous Dielectric Induced Skew Modeling of Twinax Cables. IEEE Transactions on Signal and Power Integrity, 2 (). Retrieved from https://par.nsf.gov/biblio/10465741. https://doi.org/10.1109/TSIPI.2023.3278613

Liu, Yuanzhuo, Bai, Siqi, Li, Chaofeng, De Moura, Vanine Sabino, Chen, Bichen, Venkataraman, Srinivas, Wang, Xu, and Kim, DongHyun. "Inhomogeneous Dielectric Induced Skew Modeling of Twinax Cables". IEEE Transactions on Signal and Power Integrity 2 (). Country unknown/Code not available. https://doi.org/10.1109/TSIPI.2023.3278613. https://par.nsf.gov/biblio/10465741.

@article{osti_10465741,
place = {Country unknown/Code not available}, title = {Inhomogeneous Dielectric Induced Skew Modeling of Twinax Cables}, url = {https://par.nsf.gov/biblio/10465741}, DOI = {10.1109/TSIPI.2023.3278613}, abstractNote = {}, journal = {IEEE Transactions on Signal and Power Integrity}, volume = {2}, author = {Liu, Yuanzhuo and Bai, Siqi and Li, Chaofeng and De Moura, Vanine Sabino and Chen, Bichen and Venkataraman, Srinivas and Wang, Xu and Kim, DongHyun}, }