Olugbade, Emmanuel, Pham, Hiep, He, Yuchu, Zhou, Haicheng, Hwang, Chulsoon, and Park, Jonghyun. Oxidation Layer Formation on Aluminum Substrates with Surface Defects using Molecular Dynamics Simulation. Retrieved from https://par.nsf.gov/biblio/10465828. 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) . Web. doi:10.1109/EMCSIPI50001.2023.10241439.

Olugbade, Emmanuel, Pham, Hiep, He, Yuchu, Zhou, Haicheng, Hwang, Chulsoon, & Park, Jonghyun. Oxidation Layer Formation on Aluminum Substrates with Surface Defects using Molecular Dynamics Simulation. 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI), (). Retrieved from https://par.nsf.gov/biblio/10465828. https://doi.org/10.1109/EMCSIPI50001.2023.10241439

Olugbade, Emmanuel, Pham, Hiep, He, Yuchu, Zhou, Haicheng, Hwang, Chulsoon, and Park, Jonghyun. "Oxidation Layer Formation on Aluminum Substrates with Surface Defects using Molecular Dynamics Simulation". 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) (). Country unknown/Code not available. https://doi.org/10.1109/EMCSIPI50001.2023.10241439. https://par.nsf.gov/biblio/10465828.

@article{osti_10465828,
place = {Country unknown/Code not available}, title = {Oxidation Layer Formation on Aluminum Substrates with Surface Defects using Molecular Dynamics Simulation}, url = {https://par.nsf.gov/biblio/10465828}, DOI = {10.1109/EMCSIPI50001.2023.10241439}, abstractNote = {}, journal = {2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)}, author = {Olugbade, Emmanuel and Pham, Hiep and He, Yuchu and Zhou, Haicheng and Hwang, Chulsoon and Park, Jonghyun}, }