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Title: Storage-Based Logic Built-In Self-Test With Cyclic Tests
Award ID(s):
2041649
PAR ID:
10466712
Author(s) / Creator(s):
Publisher / Repository:
IEEE
Date Published:
Journal Name:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume:
42
Issue:
9
ISSN:
0278-0070
Page Range / eLocation ID:
3118 to 3122
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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