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Title: Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests
Award ID(s):
2041649
PAR ID:
10466717
Author(s) / Creator(s):
Publisher / Repository:
IEEE
Date Published:
Journal Name:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume:
31
Issue:
9
ISSN:
1063-8210
Page Range / eLocation ID:
1259 to 1268
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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