Cai, Fulin, Patharkar, Abhidnya, Wu, Teresa, Lure, Fleming Y., Chen, Harry, and Chen, Victor C. STRIDE: Systematic Radar Intelligence Analysis for ADRD Risk Evaluation With Gait Signature Simulation and Deep Learning. Retrieved from https://par.nsf.gov/biblio/10466912. IEEE Sensors Journal 23.10 Web. doi:10.1109/JSEN.2023.3263071.

Cai, Fulin, Patharkar, Abhidnya, Wu, Teresa, Lure, Fleming Y., Chen, Harry, & Chen, Victor C. STRIDE: Systematic Radar Intelligence Analysis for ADRD Risk Evaluation With Gait Signature Simulation and Deep Learning. IEEE Sensors Journal, 23 (10). Retrieved from https://par.nsf.gov/biblio/10466912. https://doi.org/10.1109/JSEN.2023.3263071

Cai, Fulin, Patharkar, Abhidnya, Wu, Teresa, Lure, Fleming Y., Chen, Harry, and Chen, Victor C. "STRIDE: Systematic Radar Intelligence Analysis for ADRD Risk Evaluation With Gait Signature Simulation and Deep Learning". IEEE Sensors Journal 23 (10). Country unknown/Code not available: IEEE Sensor. https://doi.org/10.1109/JSEN.2023.3263071. https://par.nsf.gov/biblio/10466912.

@article{osti_10466912,
place = {Country unknown/Code not available}, title = {STRIDE: Systematic Radar Intelligence Analysis for ADRD Risk Evaluation With Gait Signature Simulation and Deep Learning}, url = {https://par.nsf.gov/biblio/10466912}, DOI = {10.1109/JSEN.2023.3263071}, abstractNote = {}, journal = {IEEE Sensors Journal}, volume = {23}, number = {10}, publisher = {IEEE Sensor}, author = {Cai, Fulin and Patharkar, Abhidnya and Wu, Teresa and Lure, Fleming Y. and Chen, Harry and Chen, Victor C.}, }