Zhang, Huixin, Xi, Xiaopeng, and Pan, Rong. A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks. Retrieved from https://par.nsf.gov/biblio/10471391. Reliability Engineering & System Safety 237.C Web. doi:10.1016/j.ress.2023.109332.

Zhang, Huixin, Xi, Xiaopeng, & Pan, Rong. A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks. Reliability Engineering & System Safety, 237 (C). Retrieved from https://par.nsf.gov/biblio/10471391. https://doi.org/10.1016/j.ress.2023.109332

Zhang, Huixin, Xi, Xiaopeng, and Pan, Rong. "A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks". Reliability Engineering & System Safety 237 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.ress.2023.109332. https://par.nsf.gov/biblio/10471391.

@article{osti_10471391,
place = {Country unknown/Code not available}, title = {A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks}, url = {https://par.nsf.gov/biblio/10471391}, DOI = {10.1016/j.ress.2023.109332}, abstractNote = {}, journal = {Reliability Engineering & System Safety}, volume = {237}, number = {C}, publisher = {Elsevier}, author = {Zhang, Huixin and Xi, Xiaopeng and Pan, Rong}, }