In this work, we investigate misfit dislocations in PbTe/PbSe heteroepitaxial systems using the concurrent atomistic–continuum (CAC) method. A potential model containing the long-range Coulombic interaction and short-range Buckingham potential is developed for the system. By considering the minimum potential energy of relaxed interface structures for various initial conditions and PbTe layer thicknesses, the equilibrium structure of misfit dislocations and the dislocation spacings in PbTe/PbSe(001) heteroepitaxial thin films are obtained as a function of the PbTe layer thicknesses grown on a PbSe substrate. The critical layer thickness above which misfit dislocations inevitably form, the structure of the misfit dislocations at the interfaces, and the dependence of average dislocation spacing on PbTe layer thickness are obtained and discussed. The simulation results provide an explanation for the narrowing of the spread of the distribution of misfit dislocation spacing as layer thickness increases in PbTe/PbSe(001) heteroepitaxy.
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This content will become publicly available on November 1, 2024
Dislocation formation in the heteroepitaxial growth of PbSe/PbTe systems
The paper presents a multiscale study of the kinetic processes of the heteroepitaxial growth of the PbSe/PbTe (111) and PbTe/PbSe(001) systems, using the Concurrent Atomistic-Continuum (CAC) method as the simulation tool. The CAC simulations have reproduced the Stranski–Krastanov growth mode and the layer-by-layer growth mode of the two systems, respectively; the pyramid-shaped island morphology of the PbSe epilayer on PbTe (111), the square-like misfit dislocation networks within the PbTe/PbSe(001) interface, and the critical thickness for the PbTe/PbSe(001) system at which coherent interfaces transit to semi-coherent interfaces with the formation of misfit dislocations, all in good agreement with experimental observations. Four types of misfit dislocations are found to form during the growth of the two PbTe/PbSe heterosystems, and hexagonal-like misfit dislocation networks are observed within the PbSe/PbTe(111) interfaces. The growth processes, including the formation of misfit dislocations, have been visualized. Dislocation half-loops have been observed to nucleate from the epilayer surfaces. These half-loops extend towards the interface by climb or glide motions, interact with other half-loops, and form misfit dislocation networks at the interfaces and threading dislocations extending from interfaces to epilayer surfaces. The dominant types of misfit dislocations in both systems are found to be those with Burgers vectors parallel to the interfaces, whereas the misfit dislocations with Burgers vectors inclined to the interface have a low likelihood of generation and tend to annihilate. The size of the substrate is demonstrated to have a significant effect on the formation, evolution, and distribution of dislocations on the growth of PbSe on PbTe(111).
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- Award ID(s):
- 2121895
- NSF-PAR ID:
- 10488372
- Publisher / Repository:
- Elsevier
- Date Published:
- Journal Name:
- Acta Materialia
- Volume:
- 260
- Issue:
- C
- ISSN:
- 1359-6454
- Page Range / eLocation ID:
- 119308
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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