Thomas, Andrew M., Crozier, Peter A., Xu, Yuchen, and Matteson, David S. Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis. Retrieved from https://par.nsf.gov/biblio/10489397. Technometrics 65.4 Web. doi:10.1080/00401706.2023.2203744.

Thomas, Andrew M., Crozier, Peter A., Xu, Yuchen, & Matteson, David S. Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis. Technometrics, 65 (4). Retrieved from https://par.nsf.gov/biblio/10489397. https://doi.org/10.1080/00401706.2023.2203744

Thomas, Andrew M., Crozier, Peter A., Xu, Yuchen, and Matteson, David S. "Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis". Technometrics 65 (4). Country unknown/Code not available: Taylor and Francis. https://doi.org/10.1080/00401706.2023.2203744. https://par.nsf.gov/biblio/10489397.

@article{osti_10489397,
place = {Country unknown/Code not available}, title = {Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis}, url = {https://par.nsf.gov/biblio/10489397}, DOI = {10.1080/00401706.2023.2203744}, abstractNote = {}, journal = {Technometrics}, volume = {65}, number = {4}, publisher = {Taylor and Francis}, author = {Thomas, Andrew M. and Crozier, Peter A. and Xu, Yuchen and Matteson, David S.}, }