Dai, Ben, Shen, Xiaotong, and Pan, Wei. Significance Tests of Feature Relevance for a Black-Box Learner. IEEE Transactions on Neural Networks and Learning Systems 35.2 Web. doi:10.1109/TNNLS.2022.3185742.

Dai, Ben, Shen, Xiaotong, & Pan, Wei. Significance Tests of Feature Relevance for a Black-Box Learner. IEEE Transactions on Neural Networks and Learning Systems, 35 (2). https://doi.org/10.1109/TNNLS.2022.3185742

Dai, Ben, Shen, Xiaotong, and Pan, Wei. "Significance Tests of Feature Relevance for a Black-Box Learner". IEEE Transactions on Neural Networks and Learning Systems 35 (2). Country unknown/Code not available: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/TNNLS.2022.3185742. https://par.nsf.gov/biblio/10489559.

@article{osti_10489559,
place = {Country unknown/Code not available}, title = {Significance Tests of Feature Relevance for a Black-Box Learner}, url = {https://par.nsf.gov/biblio/10489559}, DOI = {10.1109/TNNLS.2022.3185742}, abstractNote = {Not Available}, journal = {IEEE Transactions on Neural Networks and Learning Systems}, volume = {35}, number = {2}, publisher = {Institute of Electrical and Electronics Engineers}, author = {Dai, Ben and Shen, Xiaotong and Pan, Wei}, }