Dai, Sihui, Ding, Wenxin, Bhagoji, Arjun Nitin, Cullina, Daniel, Zheng, Haitao, Zhao, Ben Y., and Mittal, Prateek. Characterizing the Optimal 0-1 Loss for Multi-class Classification with a Test-time Attacker.

Dai, Sihui, Ding, Wenxin, Bhagoji, Arjun Nitin, Cullina, Daniel, Zheng, Haitao, Zhao, Ben Y., & Mittal, Prateek. Characterizing the Optimal 0-1 Loss for Multi-class Classification with a Test-time Attacker.

Dai, Sihui, Ding, Wenxin, Bhagoji, Arjun Nitin, Cullina, Daniel, Zheng, Haitao, Zhao, Ben Y., and Mittal, Prateek. "Characterizing the Optimal 0-1 Loss for Multi-class Classification with a Test-time Attacker". Country unknown/Code not available: Advances in Neural Information Processing Systems. https://par.nsf.gov/biblio/10495504.

@article{osti_10495504,
place = {Country unknown/Code not available}, title = {Characterizing the Optimal 0-1 Loss for Multi-class Classification with a Test-time Attacker}, url = {https://par.nsf.gov/biblio/10495504}, abstractNote = {}, journal = {}, volume = {36}, publisher = {Advances in Neural Information Processing Systems}, author = {Dai, Sihui and Ding, Wenxin and Bhagoji, Arjun Nitin and Cullina, Daniel and Zheng, Haitao and Zhao, Ben Y. and Mittal, Prateek}, }