Pattern-Based Peephole Optimizations with Java JIT Tests

Zang, Zhiqiang; Thimmaiah, Aditya; Gligoric, Milos

doi:10.1145/3597926.3598038

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Citation Details

Pattern-Based Peephole Optimizations with Java JIT Tests

Award ID(s):: 1652517 2107291 2217696

PAR ID:: 10499497

Author(s) / Creator(s):: Zang, Zhiqiang; Thimmaiah, Aditya; Gligoric, Milos

Publisher / Repository:: ACM

Date Published:: 2023-07-12

ISBN:: 9798400702211

Page Range / eLocation ID:: 64 to 75

Format(s):: Medium: X

Location:: Seattle WA USA

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.1145/3597926.3598038

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