van Wees, Lloyd, Singh, Amit, Obstalecki, Mark, Shade, Paul, Turner, Todd, and Kasemer, Matthew. An assessment of polarized light microscopy as a characterization method for crystal plasticity simulations. Retrieved from https://par.nsf.gov/biblio/10505070. Materialia 31.C Web. doi:10.1016/j.mtla.2023.101872.

van Wees, Lloyd, Singh, Amit, Obstalecki, Mark, Shade, Paul, Turner, Todd, & Kasemer, Matthew. An assessment of polarized light microscopy as a characterization method for crystal plasticity simulations. Materialia, 31 (C). Retrieved from https://par.nsf.gov/biblio/10505070. https://doi.org/10.1016/j.mtla.2023.101872

van Wees, Lloyd, Singh, Amit, Obstalecki, Mark, Shade, Paul, Turner, Todd, and Kasemer, Matthew. "An assessment of polarized light microscopy as a characterization method for crystal plasticity simulations". Materialia 31 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.mtla.2023.101872. https://par.nsf.gov/biblio/10505070.

@article{osti_10505070,
place = {Country unknown/Code not available}, title = {An assessment of polarized light microscopy as a characterization method for crystal plasticity simulations}, url = {https://par.nsf.gov/biblio/10505070}, DOI = {10.1016/j.mtla.2023.101872}, abstractNote = {}, journal = {Materialia}, volume = {31}, number = {C}, publisher = {Elsevier}, author = {van Wees, Lloyd and Singh, Amit and Obstalecki, Mark and Shade, Paul and Turner, Todd and Kasemer, Matthew}, }