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High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure.
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Novel signatures of radiation reaction in electron–laser sidescattering
Abstract In this article we investigate novel signatures of radiation reaction via the angular deflection of an electron beam colliding at 90 degrees with an intense laser pulse. Due to the radiation reaction effect, the electrons can be deflected towards the beam axis for plane wave backgrounds, which is not possible in the absence of radiation reaction effects. The magnitude and size of the deflection angle can be controlled by tailoring the laser pulse shapes. The effect is first derived analytically using the Landau–Lifshitz equation, which allows to determine the important scaling behavior with laser intensity and particle energy. We then move on to full scale 3D Monte Carlo simulations to verify the effect is observable with present day laser technology. We investigate the opportunities for an indirect observation of laser depletion in such side scattering scenarios.
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- PAR ID:
- 10512759
- Publisher / Repository:
- IOP Publishing
- Date Published:
- Journal Name:
- New Journal of Physics
- Volume:
- 26
- Issue:
- 6
- ISSN:
- 1367-2630
- Format(s):
- Medium: X Size: Article No. 063011
- Size(s):
- Article No. 063011
- Sponsoring Org:
- National Science Foundation
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