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Abstract Two‐dimensional coordination polymers (2DCPs) have been predicted to exhibit exotic properties such as superconductivity, topological insulating behavior, catalytic activity, and superior ion transport for energy applications; experimentally, these materials have fallen short of their expectation due to the lack of synthesis protocols that yield continuous, large crystallite domains, and highly ordered thin films with controllable physical and chemical properties. Herein, the fabrication of large‐area, highly ordered 2DCP thin films with large crystallite domains using chemical vapor deposition (CVD) approaches is described. It is demonstrated that defects and the packing motifs of 2DCP thin films may be controlled by adjusting the vapor–vapor and vapor–solid interactions of the metal and organic linker precursors during the CVD fabrication process. Such control allows for the fabrication of defects‐controlled 2DCP thin films that show either semiconducting or metallic behavior. The findings provide the first demonstration of tuning the electrical properties of sub 100 nm‐thick continuous 2DCP thin films by controlling their electronic landscape through defect engineering. As such, it is determined that large‐area, highly ordered 2DCP thin films may undergo a semiconducting to metallic transition that is correlated to changes in morphology, crystalline domain sizes, crystallite orientation, defect interactions, and electronic structure.
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Screening for electrically conductive defects in thin functional films using electrochemiluminescence
Multifunctional thin films in energy-related devices often must be electrically insulating where a single nanoscale defect can result in complete device-scale failure. Locating and characterizing such defects presents a fundamental problem where high-resolution imaging methods are needed to find defects, but imaging with high spatial resolution limits the field of view and thus the measurement throughput. Here, we present a novel high-throughput method for detecting sub-micron defects in insulating thin films by leveraging the electrochemiluminescence (ECL) of luminol. Through a systematic study of reagent concentrations, buffers, voltage, and excitation time, we identify optimized conditions at which it is possible to detect sub-micron defects at high-throughput. Extrapolating from the signal to background observed for detecting 440 nm wide lines and 620 nm diameter circles, we estimate the minimum detectable features to be lines as narrow as 2.5 nm in width and pinholes as small as 70 nm in radius. We further explore this method by using it to characterize a nominally insulating phenol film and find conductive defects that are cross-correlated with high-resolution atomic force microscopy to provide feedback to synthesis. Given this assay’s inherent parallelizability and scalability, it is expected to have a major impact on the automated discovery of multifunctional films.
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- Award ID(s):
- 2146597
- PAR ID:
- 10514657
- Publisher / Repository:
- Royal Society of Chemistry
- Date Published:
- Journal Name:
- Analytical Methods
- Volume:
- 15
- Issue:
- 29
- ISSN:
- 1759-9660
- Page Range / eLocation ID:
- 3592 - 3600
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1039/D3AY00687E
