Bahrami, J, Ebrahimabadi, M, Guilley, S, Danger, JL, and Karimi, N. Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators. Retrieved from https://par.nsf.gov/biblio/10515366. Constructive Side-Channel Analysis and Secure Design. (COSADE) . Web. doi:10.1007/978-3-031-57543-3_10.

Bahrami, J, Ebrahimabadi, M, Guilley, S, Danger, JL, & Karimi, N. Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators. Constructive Side-Channel Analysis and Secure Design. (COSADE), (). Retrieved from https://par.nsf.gov/biblio/10515366. https://doi.org/10.1007/978-3-031-57543-3_10

Bahrami, J, Ebrahimabadi, M, Guilley, S, Danger, JL, and Karimi, N. "Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators". Constructive Side-Channel Analysis and Secure Design. (COSADE) (). Country unknown/Code not available: Springer COSADE. https://doi.org/10.1007/978-3-031-57543-3_10. https://par.nsf.gov/biblio/10515366.

@article{osti_10515366,
place = {Country unknown/Code not available}, title = {Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators}, url = {https://par.nsf.gov/biblio/10515366}, DOI = {10.1007/978-3-031-57543-3_10}, abstractNote = {}, journal = {Constructive Side-Channel Analysis and Secure Design. (COSADE)}, publisher = {Springer COSADE}, author = {Bahrami, J and Ebrahimabadi, M and Guilley, S and Danger, JL and Karimi, N}, }