Gajula, Kaushik, Le, Vu, Yao, Xiu, Zou, Shaofeng, and Herrera, Luis. A Probabilistic Approach to Series Arc Fault Detection and Identification in DC Microgrids. Retrieved from https://par.nsf.gov/biblio/10517411. IEEE Journal of Emerging and Selected Topics in Industrial Electronics 5.1 Web. doi:10.1109/JESTIE.2023.3331183.

Gajula, Kaushik, Le, Vu, Yao, Xiu, Zou, Shaofeng, & Herrera, Luis. A Probabilistic Approach to Series Arc Fault Detection and Identification in DC Microgrids. IEEE Journal of Emerging and Selected Topics in Industrial Electronics, 5 (1). Retrieved from https://par.nsf.gov/biblio/10517411. https://doi.org/10.1109/JESTIE.2023.3331183

Gajula, Kaushik, Le, Vu, Yao, Xiu, Zou, Shaofeng, and Herrera, Luis. "A Probabilistic Approach to Series Arc Fault Detection and Identification in DC Microgrids". IEEE Journal of Emerging and Selected Topics in Industrial Electronics 5 (1). Country unknown/Code not available: IEEE. https://doi.org/10.1109/JESTIE.2023.3331183. https://par.nsf.gov/biblio/10517411.

@article{osti_10517411,
place = {Country unknown/Code not available}, title = {A Probabilistic Approach to Series Arc Fault Detection and Identification in DC Microgrids}, url = {https://par.nsf.gov/biblio/10517411}, DOI = {10.1109/JESTIE.2023.3331183}, abstractNote = {}, journal = {IEEE Journal of Emerging and Selected Topics in Industrial Electronics}, volume = {5}, number = {1}, publisher = {IEEE}, author = {Gajula, Kaushik and Le, Vu and Yao, Xiu and Zou, Shaofeng and Herrera, Luis}, }