Breaking the Limits of Scanning Tunneling Microscopy Using Image Super Resolution

Li, Rockwell T; Wijerathna, Shashika; Zhang, Yuan

doi:10.1109/ICMLA58977.2023.00170

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Citation Details

Breaking the Limits of Scanning Tunneling Microscopy Using Image Super Resolution

Award ID(s):: 2213366

PAR ID:: 10519009

Author(s) / Creator(s):: Li, Rockwell T; Wijerathna, Shashika; Zhang, Yuan

Publisher / Repository:: IEEE

Date Published:: 2023-12-15

ISBN:: 979-8-3503-4534-6

Page Range / eLocation ID:: 1138 to 1143

Format(s):: Medium: X

Location:: Jacksonville, FL, USA

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.1109/ICMLA58977.2023.00170

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