Bendory, Tamir, and Edidin, Dan. The Sample Complexity of Sparse Multireference Alignment and Single-Particle Cryo-Electron Microscopy. Retrieved from https://par.nsf.gov/biblio/10520896. SIAM Journal on Mathematics of Data Science 6.2 Web. doi:10.1137/23M155685X.

Bendory, Tamir, & Edidin, Dan. The Sample Complexity of Sparse Multireference Alignment and Single-Particle Cryo-Electron Microscopy. SIAM Journal on Mathematics of Data Science, 6 (2). Retrieved from https://par.nsf.gov/biblio/10520896. https://doi.org/10.1137/23M155685X

Bendory, Tamir, and Edidin, Dan. "The Sample Complexity of Sparse Multireference Alignment and Single-Particle Cryo-Electron Microscopy". SIAM Journal on Mathematics of Data Science 6 (2). Country unknown/Code not available: Society for Industrial and Applied Mathematics. https://doi.org/10.1137/23M155685X. https://par.nsf.gov/biblio/10520896.

@article{osti_10520896,
place = {Country unknown/Code not available}, title = {The Sample Complexity of Sparse Multireference Alignment and Single-Particle Cryo-Electron Microscopy}, url = {https://par.nsf.gov/biblio/10520896}, DOI = {10.1137/23M155685X}, abstractNote = {}, journal = {SIAM Journal on Mathematics of Data Science}, volume = {6}, number = {2}, publisher = {Society for Industrial and Applied Mathematics}, author = {Bendory, Tamir and Edidin, Dan}, }