Genssler, Paul R, Barkam, Hamza E, Pandaram, Karthik, Imani, Mohsen, and Amrouch, Hussam. Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning. Retrieved from https://par.nsf.gov/biblio/10531092. IEEE Transactions on Circuits and Systems I: Regular Papers 70.9 Web. doi:10.1109/TCSI.2023.3289325.

Genssler, Paul R, Barkam, Hamza E, Pandaram, Karthik, Imani, Mohsen, & Amrouch, Hussam. Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning. IEEE Transactions on Circuits and Systems I: Regular Papers, 70 (9). Retrieved from https://par.nsf.gov/biblio/10531092. https://doi.org/10.1109/TCSI.2023.3289325

Genssler, Paul R, Barkam, Hamza E, Pandaram, Karthik, Imani, Mohsen, and Amrouch, Hussam. "Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning". IEEE Transactions on Circuits and Systems I: Regular Papers 70 (9). Country unknown/Code not available: IEEE Transactions on Circuits and Systems I: Regular Papers. https://doi.org/10.1109/TCSI.2023.3289325. https://par.nsf.gov/biblio/10531092.

@article{osti_10531092,
place = {Country unknown/Code not available}, title = {Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning}, url = {https://par.nsf.gov/biblio/10531092}, DOI = {10.1109/TCSI.2023.3289325}, abstractNote = {}, journal = {IEEE Transactions on Circuits and Systems I: Regular Papers}, volume = {70}, number = {9}, publisher = {IEEE Transactions on Circuits and Systems I: Regular Papers}, author = {Genssler, Paul R and Barkam, Hamza E and Pandaram, Karthik and Imani, Mohsen and Amrouch, Hussam}, }