Wang, Dawei, Mudiyanselage, Dinusha Herath, He, Ziyi, Da, Bingcheng, and Fu, Houqiang. Instability of On-Resistance in Vertical GaN PIN Diodes Under High-Temperature and Voltage Stress. Retrieved from https://par.nsf.gov/biblio/10531397. IEEE Transactions on Electron Devices 71.3 Web. doi:10.1109/TED.2023.3344426.

Wang, Dawei, Mudiyanselage, Dinusha Herath, He, Ziyi, Da, Bingcheng, & Fu, Houqiang. Instability of On-Resistance in Vertical GaN PIN Diodes Under High-Temperature and Voltage Stress. IEEE Transactions on Electron Devices, 71 (3). Retrieved from https://par.nsf.gov/biblio/10531397. https://doi.org/10.1109/TED.2023.3344426

Wang, Dawei, Mudiyanselage, Dinusha Herath, He, Ziyi, Da, Bingcheng, and Fu, Houqiang. "Instability of On-Resistance in Vertical GaN PIN Diodes Under High-Temperature and Voltage Stress". IEEE Transactions on Electron Devices 71 (3). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TED.2023.3344426. https://par.nsf.gov/biblio/10531397.

@article{osti_10531397,
place = {Country unknown/Code not available}, title = {Instability of On-Resistance in Vertical GaN PIN Diodes Under High-Temperature and Voltage Stress}, url = {https://par.nsf.gov/biblio/10531397}, DOI = {10.1109/TED.2023.3344426}, abstractNote = {}, journal = {IEEE Transactions on Electron Devices}, volume = {71}, number = {3}, publisher = {IEEE}, author = {Wang, Dawei and Mudiyanselage, Dinusha Herath and He, Ziyi and Da, Bingcheng and Fu, Houqiang}, }