Pham, Van Dong, González, César, Dappe, Yannick J, Dong, Chengye, Robinson, Joshua A, Trampert, Achim, and Engel-Herbert, Roman. Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy. Retrieved from https://par.nsf.gov/biblio/10541030. Carbon 227.C Web. doi:10.1016/j.carbon.2024.119260.

Pham, Van Dong, González, César, Dappe, Yannick J, Dong, Chengye, Robinson, Joshua A, Trampert, Achim, & Engel-Herbert, Roman. Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy. Carbon, 227 (C). Retrieved from https://par.nsf.gov/biblio/10541030. https://doi.org/10.1016/j.carbon.2024.119260

Pham, Van Dong, González, César, Dappe, Yannick J, Dong, Chengye, Robinson, Joshua A, Trampert, Achim, and Engel-Herbert, Roman. "Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy". Carbon 227 (C). Country unknown/Code not available: Carbon. https://doi.org/10.1016/j.carbon.2024.119260. https://par.nsf.gov/biblio/10541030.

@article{osti_10541030,
place = {Country unknown/Code not available}, title = {Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy}, url = {https://par.nsf.gov/biblio/10541030}, DOI = {10.1016/j.carbon.2024.119260}, abstractNote = {}, journal = {Carbon}, volume = {227}, number = {C}, publisher = {Carbon}, author = {Pham, Van Dong and González, César and Dappe, Yannick J and Dong, Chengye and Robinson, Joshua A and Trampert, Achim and Engel-Herbert, Roman}, }