Miao, Leixin, Sivak, Jacob T, Kotsonis, George, Ciston, Jim, Ophus, Colin L, Dabo, Ismaila, Maria, Jon-Paul, Sinnott, Susan B, and Alem, Nasim. Chemical Environment and Structural Variations in High Entropy Oxide Thin Film Probed with Electron Microscopy. Retrieved from https://par.nsf.gov/biblio/10541048. ACS Nano 18.23 Web. doi:10.1021/acsnano.4c00787.

Miao, Leixin, Sivak, Jacob T, Kotsonis, George, Ciston, Jim, Ophus, Colin L, Dabo, Ismaila, Maria, Jon-Paul, Sinnott, Susan B, & Alem, Nasim. Chemical Environment and Structural Variations in High Entropy Oxide Thin Film Probed with Electron Microscopy. ACS Nano, 18 (23). Retrieved from https://par.nsf.gov/biblio/10541048. https://doi.org/10.1021/acsnano.4c00787

Miao, Leixin, Sivak, Jacob T, Kotsonis, George, Ciston, Jim, Ophus, Colin L, Dabo, Ismaila, Maria, Jon-Paul, Sinnott, Susan B, and Alem, Nasim. "Chemical Environment and Structural Variations in High Entropy Oxide Thin Film Probed with Electron Microscopy". ACS Nano 18 (23). Country unknown/Code not available: American Chemical Society Publications. https://doi.org/10.1021/acsnano.4c00787. https://par.nsf.gov/biblio/10541048.

@article{osti_10541048,
place = {Country unknown/Code not available}, title = {Chemical Environment and Structural Variations in High Entropy Oxide Thin Film Probed with Electron Microscopy}, url = {https://par.nsf.gov/biblio/10541048}, DOI = {10.1021/acsnano.4c00787}, abstractNote = {}, journal = {ACS Nano}, volume = {18}, number = {23}, publisher = {American Chemical Society Publications}, author = {Miao, Leixin and Sivak, Jacob T and Kotsonis, George and Ciston, Jim and Ophus, Colin L and Dabo, Ismaila and Maria, Jon-Paul and Sinnott, Susan B and Alem, Nasim}, }