Abstract Recent progress in microspherical superlens nanoscopy raises a fundamental question about the transition from super-resolution properties of mesoscale microspheres, which can provide a subwavelength resolution$$\sim \lambda /7$$ , to macroscale ball lenses, for which the imaging quality degrades because of aberrations. To address this question, this work develops a theory describing the imaging by contact ball lenses with diameters$$30 covering this transition range and for a broad range of refractive indices$$1.3<2.1$$ . Starting from geometrical optics we subsequently proceed to an exact numerical solution of the Maxwell equations explaining virtual and real image formation as well as magnificationMand resolution near the critical index$$n\approx 2$$ which is of interest for applications demanding the highestMsuch as cellphone microscopy. The wave effects manifest themselves in a strong dependence of the image plane position and magnification on$$D/\lambda $$ , for which a simple analytical formula is derived. It is demonstrated that a subwavelength resolution is achievable at$$D/\lambda \lesssim 1400$$ . The theory explains the results of experimental contact-ball imaging. The understanding of the physical mechanisms of image formation revealed in this study creates a basis for developing applications of contact ball lenses in cellphone-based microscopy.
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Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam. Multiple types of measurement noise limit the ultimate trade-off between the image quality and the incident particle dose, which can preclude useful imaging of dose-sensitive samples. Existing methods to improve image quality do not fundamentally mitigate the noise sources. Furthermore, barriers to assigning a physically meaningful scale make the images qualitative. Here, we introduce ion count-aided microscopy (ICAM), which is a quantitative imaging technique that uses statistically principled estimation of the secondary electron yield. With a readily implemented change in data collection, ICAM substantially reduces source shot noise. In helium ion microscopy, we demonstrate 3 dose reduction and a good match between these empirical results and theoretical performance predictions. ICAM facilitates imaging of fragile samples and may make imaging with heavier particles more attractive.
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- Award ID(s):
- 2039762
- PAR ID:
- 10541100
- Publisher / Repository:
- National Academy of Sciences
- Date Published:
- Journal Name:
- Proceedings of the National Academy of Sciences
- Volume:
- 121
- Issue:
- 31
- ISSN:
- 0027-8424
- Page Range / eLocation ID:
- e2401246121
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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