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Title: Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery
Time-to-first-spike(TTFS ) encoded spiking neural networks (SNNs), implemented using memristive crossbar arrays (MCA), achieve higher inference speed and energy efficiency compared to artificial neural networks (ANNs) and rate encoded SNNs. However, memristive crossbar arrays are vulnerable to conductance variations in the embedded memristor cells. These degrade the performance of TTFS encoded SNNs, namely their classification accuracy with adverse impact on the yield of manufactured chips. To combat this yield loss, we propose a post-manufacture testing and tuning framework for these SNNs. In the testing phase, a timing encoded signature of the SNN, which is statistically correlated to the SNN performance, is extracted. In the tuning phase, this signature is mapped to optimal values of the tuning knobs (gain parameters), one parameter per layer, using a trained regressor, allowing very fast tuning (about 150ms). To further reduce the tuning overhead, we rank order hidden layer neurons based on their criticality and show that adding gain programmability only to 50% of the neurons is sufficient for performance recovery. Experiments show that the proposed framework can improve yield by up to 34% and average accuracy of memristive SNNs by up to 9%.  more » « less
Award ID(s):
2128419
PAR ID:
10541878
Author(s) / Creator(s):
; ; ;
Publisher / Repository:
IEEE
Date Published:
ISBN:
979-8-3503-4932-0
Page Range / eLocation ID:
1 to 4
Format(s):
Medium: X
Location:
The Hague, Netherlands
Sponsoring Org:
National Science Foundation
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