Satterlee, Nicholas, Jiang, Runjian, Olevsky, Eugene, Torresani, Elisa, Zuo, Xiaowei, and Kang, John S. Robust image-based cross-sectional grain boundary detection and characterization using machine learning. Retrieved from https://par.nsf.gov/biblio/10543606. Journal of Intelligent Manufacturing . Web. doi:10.1007/s10845-024-02383-6.

Satterlee, Nicholas, Jiang, Runjian, Olevsky, Eugene, Torresani, Elisa, Zuo, Xiaowei, & Kang, John S. Robust image-based cross-sectional grain boundary detection and characterization using machine learning. Journal of Intelligent Manufacturing, (). Retrieved from https://par.nsf.gov/biblio/10543606. https://doi.org/10.1007/s10845-024-02383-6

Satterlee, Nicholas, Jiang, Runjian, Olevsky, Eugene, Torresani, Elisa, Zuo, Xiaowei, and Kang, John S. "Robust image-based cross-sectional grain boundary detection and characterization using machine learning". Journal of Intelligent Manufacturing (). Country unknown/Code not available: Springer Nature. https://doi.org/10.1007/s10845-024-02383-6. https://par.nsf.gov/biblio/10543606.

@article{osti_10543606,
place = {Country unknown/Code not available}, title = {Robust image-based cross-sectional grain boundary detection and characterization using machine learning}, url = {https://par.nsf.gov/biblio/10543606}, DOI = {10.1007/s10845-024-02383-6}, abstractNote = {}, journal = {Journal of Intelligent Manufacturing}, publisher = {Springer Nature}, author = {Satterlee, Nicholas and Jiang, Runjian and Olevsky, Eugene and Torresani, Elisa and Zuo, Xiaowei and Kang, John S}, }